XAFS and TOF-SIMS analysis of SEI layers on electrodes

By H. Ota, T. Akai, H. Namita, S. Yamaguchi, M. Nomura. 2003

149 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/4652d23357714477e134cefdf9b7e2f421cf2a83