Handbook of Ellipsometry

By H. Tompkins, E. Irene. 2005

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Conductive nitrides: Growth principles, optical and electronic properties, and their perspectives in photonics and plasmonics (2018, background): “r f 1⁄4 tanc e 1⁄4 r p rs : (6) Then, the real and imaginary parts of the dielectric function ẽ 1⁄4 e1 þ ie2 can by analytically calculated from rf and the angle of incidence f (usually in the range 55–758) as [569]:”
Nanoparticle classification, physicochemical properties, characterization, and applications: a comprehensive review for biologists (2022, neutral): “It is widely used to calculate the optical constants of a material (refractive index and extinction coefficient) [209].”
Optical dielectric function of silver (2015, methodology): “By measuring only the relative reflectivities of different polarizations, ellipsometry does not require a reference sample or Kramers-Kronig analysis [48,69].”
Chirality-induced polarization effects in the cuticle of scarab beetles: 100 years after Michelson (2012, methodology): “For resolving optical and structural properties in detail, a more powerful method than reflectometry is ellipsometry [22].”