Engineering Solutions and Root-Cause Analysis for Light-Induced Degradation in p-Type Multicrystalline Silicon PERC Modules

By K. Nakayashiki, J. Hofstetter, A. Morishige, T. Li, D. B. Needleman, M. Jensen, Tonio Buonassisi. IEEE Journal of Photovoltaics, 2016

136 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/44dd7dd66dfcd6fcc6e999e4f1117c4a40550bde