Kelvin Probe Study of Band Bending at Organic Semiconductor/Metal Interfaces: Examination of Fermi Level Alignment

By H. Ishii, N. Hayashi, E. Ito, Y. Washizu, K. Sugi, Y. Kimura, M. Niwano, Y. Ouchi, K. Seki. 2004

218 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

View Paper: https://www.semanticscholar.org/paper/44bdbe19e96164d4eaffcde7c84a3fdd96b78973

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In Electrical and Electronic Engineering

1. A. Wee
2. Xingyu Gao
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4. Wei Chen

Citations in the corpus

• Surface transfer doping of semiconductors (2009, background): “ic films in the device-relevant thickness range (a few hundred nanometers) can be investigated by other means such as the Kelvin probe [14].”