Static compaction techniques to control scan vector power dissipation

By Ranganathan Sankaralingam, R. Oruganti, N. Touba. Proceedings of the ... IEEE VLSI Test Symposium, 2000

388 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Hardware and Architecture

View Paper: https://www.semanticscholar.org/paper/443b55b52ce8892adad2fcf2523384d4b128a927