Investigation of white etching layers on rails by optical microscopy, electron microscopy, X-ray and synchrotron X-ray diffraction

By W. Österle, H. Rooch, A. Pyzalla, L. C. Wang. 2001

159 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Materials Chemistry, Mechanical Engineering

View Paper: https://www.semanticscholar.org/paper/43d976896c0b834a4d503d39552bea8ff3b2b8f0