Laplace-transform deep-level spectroscopy: the technique and its applications to the study of point defects in semiconductors

By L. Dobaczewski, A. Peaker, K. Nielsen. 2004

295 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/431d47d9606dca8ddc8252c520aa1e9e2609f97b