Measurement of optical properties of highly doped silicon by terahertz time domain reflection spectroscopy

By S. Nashima, O. Morikawa, K. Takata, M. Hangyo. 2001

154 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/40acb597a41a595ebc6c64b563b45bdb77403491