Subpixel displacement and deformation gradient measurement using digital image/speckle correlation (DISC)
By P. Zhou, Kenneth E. Goodson. 2001
441 citations recorded by the source corpus.
Subfields: Computational Mechanics, Computer Vision and Pattern Recognition, Media Technology
View Paper: https://www.semanticscholar.org/paper/403229c05266a3fd2c33fe39bfdb25fe5d3d47b0
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In Computational Mechanics
In Computer Vision and Pattern Recognition
In Media Technology
Citations in the corpus
- Full-Field Deformation Measurement and Crack Mapping on Confined Masonry Walls Using Digital Image Correlation (2014, methodology): “This is typically accomplished by using a speckle size between 2 and 5 pixels [7], and tailoring the subset size such that each subset contains at least 3×3 speckles [4].”
- Digital image correlation for surface deformation measurement: historical developments, recent advances and future goals (2018, methodology): “Apart from the iterative spatial domain CC algorithm, various other subpixel registration algorithms, including the iterative, spatial gradient-based subpixel registration algorithm [84], the gradient-based subpixel registration algorithm [105, 106], and the genetic algorithm [107–109], have also be”
- Effects of Various Shape Functions and Subset Size in Local Deformation Measurements Using DIC (2015, methodology): “A computer program [25] was used for simulations ignoring the oblique angle of the PLC shear bands.”
- Full-field strain measurement using a two-dimensional Savitzky-Golay digital differentiator in digital image correlation (2007, methodology): “.1 Homogeneous Deformation he first set of images was computer-simulated speckle imges, which were generated according to the algorithm preented by Zhou et al.5 The reference speckle image and the eformed speckle image are shown in Fig.”
- A practical approach to optimizing the preparation of speckle patterns for digital-image correlation (2014, background): “In the literature there are different studies that suggest the importance of the quality of the speckle pattern for DIC applications, especially concerning the average speckle size and variability [1, 6, 8].”