High-resolution work function imaging of single grains of semiconductor surfaces

By S. Sadewasser, T. Glatzel, M. Rusu, A. Jäger-Waldau, M. Lux‐Steiner. 2002

145 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/3f77e71d910956cde3b23b2747fc1b271edbb0b4