Instance-Level Segmentation of Vehicles by Deep Contours

By Jan Willem van den Brand, Matthias Ochs, Rudolf Mester. 2016

15 citations recorded by the source corpus.

Subfields: Computer Vision and Pattern Recognition, Industrial and Manufacturing Engineering

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Computer Vision and Pattern Recognition

1. Luc Van Gool
2. Liang-Chieh Chen
3. Alan L. Yuille
4. Chen Change Loy
5. Xiaogang Wang
6. Chunhua Shen
7. Andrea Vedaldi
8. Raquel Urtasun

In Industrial and Manufacturing Engineering

1. Luc Van Gool
2. Min Bai
3. Marc Proesmans
4. Davy Neven
5. Raquel Urtasun
6. Bert De Brabandere

Citations in the corpus

• Deep Watershed Transform for Instance Segmentation (2016, methodology): “We then perform ablation studies with the validation set to examine the performance of various aspects of our model.”
• Instance Segmentation by Jointly Optimizing Spatial Embeddings and Clustering Bandwidth (2019, methodology): “Method AP AP50 FPS Deep Contours [26] 2.”
• Box2Pix: Single-Shot Instance Segmentation by Assigning Pixels to Object Boxes (2018, unknown): “Deep Contours [43] 2.”