Does source-to-drain tunneling limit the ultimate scaling of MOSFETs?

By Jing Wang, Mark S. Lundstrom. Digest. International Electron Devices Meeting,, 2002

163 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/3f4b637b12240b52c6752c57ce1baa180c7cb91f