Characterization of thin metal films via frequency-domain thermoreflectance

By Aaron J. Schmidt, R. Cheaito, Matteo Chiesa. 2010

151 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Materials Chemistry, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/3e70737ded64d9ba686205a7a6b31f4dae01e6d0

How researchers see this paper

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In Atomic and Molecular Physics, and Optics

1. Ronggui Yang
2. Xin Qian

In Materials Chemistry

1. Xiaokun Gu
2. Ronggui Yang
3. Xin Qian
4. Dongliang Zhao
5. S. Jajja
6. Baowen Li
7. Xiaobo Yin
8. Yujie Wei

In Mechanics of Materials

1. Xin Qian
2. Dongliang Zhao
3. Ronggui Yang
4. Xiaokun Gu
5. S. Jajja

Citations in the corpus

• Measurement Techniques for Thermal Conductivity and Interfacial Thermal Conductance of Bulk and Thin Film Materials (2016, methodology): “continuous wave (CW) lasers as shown in Figure 14b, which achieves similar accuracy to TDTR measurement for thermal conductivity of many thin-film materials [98,105,106,109].”