Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system

By Mannan Ali, C. Marrows, M. Al-Jawad, B. Hickey, A. Misra, U. Nowak, K. Usadel. 2003

184 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Electronic, Optical and Magnetic Materials

View Paper: https://www.semanticscholar.org/paper/3d01c1e638da06e782546c788126e3ca04b68593

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