Guidelines for etching silicon MEMS structures using fluorine high-density plasmas at cryogenic temperatures
By M. D. Boer, H. Gardeniers, H. Jansen, Edwin Smulders, M. Gilde, G. Roelofs, Jay N. Sasserath, M. Elwenspoek. 2002
266 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Mechanics of Materials
View Paper: https://www.semanticscholar.org/paper/3c92425778449f98fdc7ff677329c5d2ef535d5f
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In Electrical and Electronic Engineering
- B. Cho
- Ghenadii Korotcenkov
- George M. Whitesides
- Eric M. Yeatman
- Giovanni Neri
- G. Vladisavljević
- Demetri Psaltis
- Zhenyu Li
In Mechanics of Materials
Citations in the corpus
- Surface tension-powered self-assembly of microstructures - the state-of-the-art (2003, methodology): “Etching of extremely deep structures is now well understood, both using the cyclic etch-passivate DRIE process [34] and with the alternative cryogenic DRIE process [35].”
- Silicon Porosification: State of the Art (2010, methodology): “319 , 320 The Bosch process utilizes a separate passivation step followed by an etching step, while in the cryo process the passivation occurs simultaneously with the etching.”