Silver thick-film contacts on highly doped n-type silicon emitters: Structural and electronic properties of the interface

By Christophe Ballif, D. Huljic, G. Willeke, A. Hessler-Wyser. 2003

280 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/3adc52c35cd8ca66aa4cd1a6281e6f86205d3071