MVTec AD — A Comprehensive Real-World Dataset for Unsupervised Anomaly Detection

By Paul Bergmann, Michael Fauser, David Sattlegger, Carsten Steger. Computer Vision and Pattern Recognition, 2019

2,187 citations recorded by the source corpus.

The detection of anomalous structures in natural image data is of utmost importance for numerous tasks in the field of computer vision. The development of methods for unsupervised anomaly detection requires data on which to train and evaluate new approaches and ideas. We introduce the MVTec Anomaly Detection (MVTec AD) dataset containing 5354 high-resolution color images of different object and texture categories. It contains normal, i.e., defect-free, images intended for training and images with anomalies intended for testing. The anomalies manifest themselves in the form of over 70 different types of defects such as scratches, dents, contaminations, and various structural changes. In addition, we provide pixel-precise ground truth regions for all anomalies. We also conduct a thorough evaluation of current state-of-the-art unsupervised anomaly detection methods based on deep architectures such as convolutional autoencoders, generative adversarial networks, and feature descriptors using pre-trained convolutional neural networks, as well as classical computer vision methods. This initial benchmark indicates that there is considerable room for improvement. To the best of our knowledge, this is the first comprehensive, multi-object, multi-defect dataset for anomaly detection that provides pixel-accurate ground truth regions and focuses on real-world applications.

Subfields: Artificial Intelligence, Computer Vision and Pattern Recognition, Industrial and Manufacturing Engineering

View Paper: https://www.semanticscholar.org/paper/3aa681914a7da79f7d7293f51a058eefe61c8bb7

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Artificial Intelligence

  1. Ziwei Liu
  2. Wojciech Samek
  3. K. Müller
  4. Fahad Shahbaz Khan
  5. Yoshua Bengio
  6. Dacheng Tao
  7. Yixuan Li
  8. Kaiyang Zhou

In Computer Vision and Pattern Recognition

  1. Luc Van Gool
  2. Dacheng Tao
  3. Ming-Hsuan Yang
  4. Xiaogang Wang
  5. Chen Change Loy
  6. Trevor Darrell
  7. Bernt Schiele
  8. Andrea Vedaldi

In Industrial and Manufacturing Engineering

  1. Kilian Batzner
  2. Lars Heckler
  3. Rebecca König
  4. Shun Ishizaka
  5. Kazuki Kozuka
  6. Denis A. Gudovskiy
  7. Hanqiu Deng
  8. Xingyu Li

Citations in the corpus