Infrared photocarrier radiometry of semiconductors: Physical principles, quantitative depth profilometry, and scanning imaging of deep subsurface electronic defects

By A. Mandelis, J. Batista, D. Shaughnessy. 2003

150 citations recorded by the source corpus.

Subfields: Aerospace Engineering, Computational Mechanics, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/39a83079375d6081c4ea93ab7443b6bfd72a9e10