A new examination of secondary electron yield data

By Yinghong Lin, D. Joy. 2005

279 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Radiation, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/34b5e1f2f744cea657d2fd275ad4efcafe4082bc

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In Electrical and Electronic Engineering

  1. V. Mennella

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