A model for fatigue in ferroelectric perovskite thin films
324 citations recorded by the source corpus.
Subfields: Biomedical Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/34428f0c57d37ac0a08ace3585d88d5131270c3a
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In Biomedical Engineering
In Electronic, Optical and Magnetic Materials
In Materials Chemistry
Citations in the corpus
- Physics of thin-film ferroelectric oxides (2005, methodology): “…does play a role in fatigue, an idea at least in part supported by the detailed experimental study of Du and Chen (1998), but in the model of Dawber and Scott (2000), (which draws upon the basic idea of Yoo and Desu (1992) that fatigue is due to the electromigration of oxygen vacancies) it…”