Full depth profile of passive films on 316L stainless steel based on high resolution HAXPES in combination with ARXPS

By W. Fredriksson, Sara Malmgren, T. Gustafsson, M. Gorgoi, K. Edström. 2012

154 citations recorded by the source corpus.

Subfields: Aerospace Engineering, Materials Chemistry, Metals and Alloys

View Paper: https://www.semanticscholar.org/paper/33ef90ce08ddeffdd21eec4acfa6b83d5cf3e180

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Aerospace Engineering

1. Chaofang Dong
2. Jizheng Yao

In Materials Chemistry

1. Chaofang Dong
2. Jizheng Yao
3. D. Macdonald

In Metals and Alloys

1. Chaofang Dong
2. Jizheng Yao
3. D. Macdonald

Citations in the corpus

• Passive film on 2205 duplex stainless steel studied by photo-electrochemistry and ARXPS methods (2019, background): “According to binding energies, which are quoted in the literatures [20,45] and are given in the NIST database, two peaks, O (530.”