Comparison of methods to quantify interface trap densities at dielectric/III-V semiconductor interfaces

By R. Engel-Herbert, Y. Hwang, Susanne Stemmer. 2010

409 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/33199516c085a0bcc54fa9daacf86a5965bb1ec7