Development of a methodology for XPS curve‐fitting of the Si 2p core level of siloxane materials

By Lesley-Ann O'Hare, B. Parbhoo, S. Leadley. 2004

161 citations recorded by the source corpus.

Subfields: Electronic, Optical and Magnetic Materials, Materials Chemistry, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/326ea4c48b4385699ffcc2aabbbbe5bdf2e0e8b5