Three-dimensional X-ray structural microscopy with submicrometre resolution

By B. Larson, Wenge Yang, G. Ice, J. Budai, J. Tischler. Nature, 2002

718 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Materials Chemistry, Structural Biology

View Paper: https://www.semanticscholar.org/paper/31ff87f1182efff152db17ede61c275789092c67

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

1. Philip Eisenlohr
2. Dierk Raabe
3. Ross J. Harder
4. Kamy Sepehrnoori
5. P. J. Withers
6. Henning Friis Poulsen
7. T. Bieler
8. Franz Roters

In Materials Chemistry

1. Franz Roters
2. Dierk Raabe
3. T. Bieler
4. Philip Eisenlohr
5. L. Hantcherli
6. D. Tjahjanto
7. Henning Friis Poulsen
8. P. J. Withers

In Structural Biology

1. Dierk Raabe
2. Ross J. Harder
3. P. J. Withers
4. Henning Friis Poulsen
5. Franz Roters
6. I. Robinson
7. Ting Zhu
8. Ju Li

Citations in the corpus

• Measuring strain distributions in amorphous materials (2004, background): “as well as on the scale of the (embedded) grains and sub-grain”
• Review of third and next generation synchrotron light sources (2005, methodology): “…ESRF, APS and SPring8 enable techniques to study all grains and their properties in the interior of a polycrystalline sample with micrometre resolution (Poulsen et al 2001, Larson et al 2002) even in situ under deformation (Margulies et al 2001) or during recrystallization (Offermann et al 2002).”
• Grain boundaries and interfaces in slip transfer (2014, positive): “Bend and tensile samples initially characterized using OIM were investigated using di ff er-ential aperture X-ray microscopy (DAXM) in beamline 34-ID-E [44] to examine subsurface grain shapes and stress tensors in samples that were unloaded.”
• Coherent X-ray diffraction imaging of strain at the nanoscale. (2009, background): “The most important strain-sensitive scanning instruments are the white-beam Laue scanning microprob”
• An introduction to three-dimensional X-ray diffraction microscopy (2012, methodology): “In particular we mention the technique of ‘differential-aperture X-ray microscopy’ (DAXM; Larson et al., 2002; Ice et al., 2005, 2011; Levine et al., 2006; Barabash et al., 2009).”
• Overview of constitutive laws, kinematics, homogenization and multiscale methods in crystal plasticity finite-element modeling: Theory, experiments, applications (2010, methodology): “In addition to these well-established methods, novel tomographic experiments allow one to compare CPFE predictions to real microstructures also in three dimensions, for instance by synchrotron orientation tomography [214,394], and EBSD tomography (3-D EBSD) [171,174,177,216, 395,396].”