Specification for a standard procedure of X-ray diffraction measurements on carbon materials

By N. Iwashita, C. Park, H. Fujimoto, M. Shiraishi, M. Inagaki. 2004

479 citations recorded by the source corpus.

Subfields: Condensed Matter Physics, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/318ccdb79579d0e82d206aeb9115e7adb27ef39d

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In Materials Chemistry

1. N. Marks

Citations in the corpus

• Universal Scherrer equation for graphene fragments (2020, background): “[7] who performed inter-laboratory tests and suggested a single universal value of K=1 for all crystallite directions.”