Bias stress in organic thin-film transistors and logic gates

By Stephan J. Zilker, C. Detcheverry, E. Cantatore, Dago M. De Leeuw. 2001

206 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/2edf7aba807bdda5e5e6122747aac7070bd1677b