Characterization of nanocrystalline materials by X-ray line profile analysis

By T. Ungár. 2007

176 citations recorded by the source corpus.

Subfields: Materials Chemistry, Mechanical Engineering

View Paper: https://www.semanticscholar.org/paper/2e9a8293647fc4146c66bdcbe1c23f0c95fbde51

Citations in the corpus

• Estimation of lattice strain in ZnO nanoparticles: X-ray peak profile analysis (2014, unknown): “[10].”