Dielectric-constant measurement of thin insulating films at low-frequency by nanoscale capacitance microscopy

By L. Fumagalli, G. Ferrari, M. Sampietro, G. Gomila. 2007

152 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering

View Paper: https://www.semanticscholar.org/paper/2e5baf5428b706937f9470c189676392c38d0ff9