Properties of residuals for spatial point processes
By Adrian Baddeley, Jesper Møller, Anthony G. Pakes. 2008
80 citations recorded by the source corpus.
Subfields: Applied Mathematics, Artificial Intelligence, Statistics and Probability
View Paper: https://www.semanticscholar.org/paper/2dedce2f2e7c16bccacfc0d14199b64bb16dd6fc
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Applied Mathematics
- Rasmus Waagepetersen
- Jesper Møller
- Alan E. Gelfand
- Thomas J. Leininger
- Adrian Baddeley
- Yongtao Guan
- M. V. Lieshout
- Carlos Díaz-Avalos
In Artificial Intelligence
- Rasmus Waagepetersen
- Jesper Møller
- Alan E. Gelfand
- Thomas J. Leininger
- Adrian Baddeley
- Athanasios Kottas
- David B. Dunson
- Edith Gabriel
In Statistics and Probability
- Rasmus Waagepetersen
- Alan E. Gelfand
- Thomas J. Leininger
- Adrian Baddeley
- Jesper Møller
- Jean‐François Coeurjolly
- Athanasios Kottas
- Andrew Gelman
Citations in the corpus
- Logistic regression for spatial Gibbs point processes (2014, background): “Each component of the vector T1,Wn(X) is a special case of innovations for spatial Gibbs point processes introduced by Baddeley et al. (2005) with variances studied by Baddeley et al. (2008) and asymptotic results225 provided by Coeurjolly & Lavancier (2013) and Coeurjolly & Rubak (2013).”
- Fractals and spatial statistics of point patterns (2013, unknown): “Mathematical statisticians (Baddeley and Turner, 2012; Baddeley et al., 2008; Baddeley, 2007; Cressie, 2001; Rowlingson and Diggle, 1993, 1991; Ripley, 1988, 1981, 1976; Diggle, 1983) have developed very precise methods to estimate the parameters of constant-density point processes.”
- Modern Statistics for Spatial Point Processes * (2007, methodology): “We therefore use the border method as follows (see also Baddeley et al., 2007a).”
- Bayesian Inference and Model Assessment for Spatial Point Patterns Using Posterior Predictive Samples (2017, methodology): “Finally, for an h-scaled innovation as in (11), Baddeley et al. (2005) define the smoothed innovation field r(u;θ) at location u ∈ D as”