Effects of the substrate on the determination of thin film mechanical properties by nanoindentation
By R. Saha, W. Nix. 2002
1,497 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Materials Chemistry, Mechanics of Materials
View Paper: https://www.semanticscholar.org/paper/2dcacf83966fd993f1b941cdf39985c6f89020e7
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In Atomic and Molecular Physics, and Optics
In Materials Chemistry
In Mechanics of Materials
Citations in the corpus
- On the uniqueness of measuring elastoplastic properties from indentation: The indistinguishable mystical materials (2007, methodology): “Various techniques have been proposed to subtract off the substrate effect from indentation analysis in order to measure the intrinsic film properties (Chen and Vlassak, 2001; Saha and Nix, 2002; Cheng and Cheng, 2004).”
- Mechanical properties of nacre constituents and their impact on mechanical performance (2006, background): “This type of effect was also reported for indentation of a thin film on a softer substrate: substrate properties influence the results already for indentation depths less than half the film thickness (see Saha et al.(23) or Bhushan et al.”