High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
By J. Orloff, M. Utlaut, L. Swanson. 2002
135 citations recorded by the source corpus.
Subfields: Computational Mechanics
View Paper: https://www.semanticscholar.org/paper/2cd986ff0d582c6488beba0e23f90f01992712af
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In Computational Mechanics
Citations in the corpus
- Focused ion beam (FIB): A novel technology for advanced application of micro- and nanoanalysis in geosciences and applied mineralogy (2004, background): “The principles of FIB milling and detailed descriptions are given elsewhere (Overwijk et al., 1993; Heaney et al., 2001; Roberts et al., 2001; Orloff et al., 2002; Lee et al., 2003).”