Highly stable amorphous In-Ga-Zn-O thin-film transistors produced by eliminating deep subgap defects

By K. Nomura, T. Kamiya, Hideo Hosono. 2011

181 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/2c808593748d5272848e593d6e0870d2404ce23b