Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging

By S. Tougaard. 2010

148 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Structural Biology, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/2c0b2a276f49abbea37ec2b525905f6b0d61a18e