Temperature dependence of dark current in a CCD

By R. Widenhorn, M. Blouke, A. Weber, Armin Rest, E. Bodegom. IS&T/SPIE Electronic Imaging, 2002

148 citations recorded by the source corpus.

Subfields: Aerospace Engineering, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/2bb7445a19082a50949ecd119c48a3cab7193c99