System voltage potential-induced degradation mechanisms in PV modules and methods for test

By P. Hacke, K. Terwilliger, Ryan M. Smith, S. Glick, J. Pankow, M. Kempe, S. K. Bennett, M. Kloos. 2011 37th IEEE Photovoltaic Specialists Conference, 2011

182 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Renewable Energy, Sustainability and the Environment

View Paper: https://www.semanticscholar.org/paper/2b1b4c84de835f738bc311de54ec079900102ad8

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Citations in the corpus

• Explanation of potential-induced degradation of the shunting type by Na decoration of stacking faults in Si solar cells (2014, background): “In addition to the observation of leakage currents [5] (caused by mobile ions in an electric field) this leads to the consideration of charge pile up at interfaces when the mobility of drifting ions decreases from one material to the following.”