Surface characterization of CeO2/SiO2 and V2O5/CeO2/SiO2 catalysts by Raman, XPS, and other techniques
By B. M. Reddy, Ataullah Khan, Yusuke Yamada, Tetsuhiko Kobayashi, S. Loridant, J. Volta. 2002
146 citations recorded by the source corpus.
Subfields: Catalysis, Inorganic Chemistry, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/29d4bd6dd470506099033d970d4c3173198d6692
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In Catalysis
In Materials Chemistry
Citations in the corpus
- Raman spectroscopy as a powerful tool to characterize ceria-based catalysts (2020, background): “In addition to structural information on molecular vanadates and determining the maximal coverage above which crystalline V2O5 is formed, Raman spectroscopy was used to follow CeVO4 formed by interaction between vanadates and ceria during thermal treatments and reactions [83,116-121].”