Electron-beam-induced strain within InGaN quantum wells: False indium “cluster” detection in the transmission electron microscope

By T. Smeeton, M. Kappers, J. Barnard, M. E. Vickers, Colin J. Humphreys. 2003

260 citations recorded by the source corpus.

Subfields: Biomedical Engineering, Condensed Matter Physics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/295a6d2a5ee27ecc0bf0f3587ac07c00d5d3e884