High-mobility three-atom-thick semiconducting films with wafer-scale homogeneity
By Kibum Kang, Saien Xie, Lujie Huang, Yimo Han, Pinshane Y. Huang, K. Mak, Cheol‐Joo Kim, D. Muller, Jiwoong Park. Nature, 2015
1,771 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/293bd3b9bf5e80ef8b75d9d7f931b9ba6d0280e4
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In Electrical and Electronic Engineering
- A. Castellanos-Gómez
- Francesco Bonaccorso
- Andrea C. Ferrari
- Ki Jun Yu
- Zheng Yan
- Mengdi Han
- Andras Kis
- C. Backes
In Materials Chemistry
- A. Castellanos-Gómez
- Kostas Kostarelos
- M. Prato
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- Andrea C. Ferrari
- Jonathan N. Coleman
Citations in the corpus
- Production and processing of graphene and related materials (2020, methodology): “[1140] developed a method to grow a wafer scale polycrystalline 1L-MoS2 films on SiO2/Si with Mo(CO)6 and (C2H5)2S (Diethyl sulfide; DES) with relatively low growth T (~550 °C), albeit with a rather long growth time to achieve a continuous film (~26 h) in low vacuum conditions (7.”
- A microprocessor based on a two-dimensional semiconductor (2016, positive): “However, as no metal catalyst is required for the synthesis of TMD films 27–30 , direct growth on the target substrate is a promising route to improve yield.”
- A roadmap for electronic grade 2D materials (2019, background): “[76] Kang K et al 2015 High-mobility three-atom-thick”
- Optoelectronic devices based on two-dimensional transition metal dichalcogenides (2016, methodology): “[65] successfully synthesized 4-inch wafer-scale films of monolayer MoS2 and WS2 with excellent coverage (Fig.”