Correlation between leakage current density and threading dislocation density in SiGe p-i-n diodes grown on relaxed graded buffer layers

By L. Giovane, H. Luan, Anuradha Murthy Agarwal, Lionel C. Kimerling. 2001

166 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Nuclear Energy and Engineering

View Paper: https://www.semanticscholar.org/paper/2896ff134bcfbd7fdd514228811877f456d9a2ed