Trap density in conducting organic semiconductors determined from temperature dependence of J−V characteristics

By Vikram Kumar, Suresh S. Jain, A. Kapoor, Jef Poortmans, R. Mertens. 2003

163 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

View Paper: https://www.semanticscholar.org/paper/278c4ef14da86f434156ca9dea30189c5c40a5e1