Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection

By J. Xi, M. Schubert, Jong Kyu Kim, E. Fred Schubert, Minfeng Chen, Shawn-Yu Lin, W. Liu, J. Smart. 2007

1,155 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/275aa9aa6713c5f35721c08572a9729302c6d82a

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

1. Loucas Tsakalakos
2. José Sánchez-Dehesa
3. A. González‐Elipe
4. Á. Barranco
5. A. Borrás
6. D. Torrent
7. Ronggui Yang
8. Xin Qian

In Electrical and Electronic Engineering

1. Loucas Tsakalakos
2. A. González‐Elipe
3. Á. Barranco
4. Dongliang Zhao
5. A. Borrás
6. Lin Yao
7. Ronggui Yang
8. Xiaokun Gu

In Surfaces, Coatings and Films

1. A. González‐Elipe
2. Á. Barranco
3. A. Borrás
4. Lin Yao
5. A. Palmero
6. Junhui He

Citations in the corpus

• Recent progress in antireflection and self-cleaning technology – From surface engineering to functional surfaces (2014, methodology): “3 by changing the vapor-deposition incident angle using the oblique-angle deposition method [69].”
• Strong broadband optical absorption in silicon nanowire films (2007, result): “the same wavelength range our samples typically show a constant total reflectance of ≤ 2% and a specular reflectance of < 1% (not shown), on par with recent data presented by Shubert and co-workers for graded index nanostructured films [21].”