Hot-Carrier acceleration factors for low power management in DC-AC stressed 40nm NMOS node at high temperature

By A. Bravaix, C. Guérin, Vincent Huard, David Roy, J. Roux, E. Vincent. IEEE International Reliability Physics Symposium, 2009

179 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/2534809e6dcb8f8db41c08beb869511c406eb948