Ultra-rare disruptive and damaging mutations influence educational attainment in the general population
By A. Ganna, G. Genovese, D. Howrigan, Andrea Byrnes, M. Kurki, S. Zekavat, Christopher W. Whelan, M. Kals, M. Nivard, Alex Bloemendal and 22 more. 2016
97 citations recorded by the source corpus.
Disruptive, damaging ultra-rare variants in highly constrained genes are enriched in individuals with neurodevelopmental disorders. In the general population, this class of variants was associated with a decrease in years of education (YOE). This effect was stronger among highly brain-expressed genes and explained more YOE variance than pathogenic copy number variation but less than common variants. Disruptive, damaging ultra-rare variants in highly constrained genes influence the determinants of YOE in the general population.
Subfields: Genetics
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In Genetics
- Huaiyu Mi
- G. Feng
- Danielle Posthuma
- Tilmann Achsel
- R. Malenka
- C. Bagni
- Haiming Tang
- Alexandros K. Kanellopoulos
Citations in the corpus
- SynGO: an evidence-based, expert-curated knowledgebase for the synapse (2019, background): “To compare SynGO genes with other brain-expressed genes, we defined two control gene sets: (1) brain-enriched genes (6,600 genes with maximal expression difference between brain and other tissues; Ganna et al., 2016) and (2) ‘‘top N’’ genesmost highly expressed in the brain, with N equal to the numb”