Theories of scanning probe microscopes at the atomic scale
By Werner A. Hofer, Adam S. Foster, Alexander L. Shluger. 2003
400 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/24bd00ad379eb0324c0de698f7c04c4d7e18199a
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In Atomic and Molecular Physics, and Optics
In Electrical and Electronic Engineering
Citations in the corpus
- Nanostructured surfaces: challenges and frontiers in nanotechnology (2004, positive): “Thus, a new frontier in nanoscience is being able to image the surface structure of insulators with atomic resolution (Giessibl 1995, 2003, Giessibl et al 2000, Hofer et al 2003).”
- Direct visualization of defect-mediated dissociation of water on TiO2(110) (2006, background): “As such, subtleties in the experimental contrast formation are likely to be missed and a more rigorous approach may be necessary to reproduce the experimentally observed contras”
- Coherent X-Ray Diffraction Imaging (2012, methodology): “Compared to scanning probe microscopy [5] and electron microscopy [4], CDI can be applied to image thick objects at high resolution in 3-D.”
- Surface nanobubbles and nanodroplets (2015, background): “AFM is a member of the family of scanning probe microscopy (SPM), which is capable of characterization and manipulation of features on an atomic scale (Binnig, Quate, and Gerber, 1986).”
- Scanning tunneling spectroscopy of high-temperature superconductors (2006, methodology): “This study illustrated the atomic character of the STM junction, which in effect can be viewed as an atom-to-atom contact see also Tsukada et al., 1983 , and initiated many subsequent works based on ab initio methods see, e.g., Ciraci and Batra, 1987; Tersoff, 1989; Hofer et al., 2001, 2003 .”