Critical thickness of ultrathin ferroelectric BaTiO3 films
By Yongjo Kim, Dae Ho Kim, Jung-Bum Kim, Y. Chang, T. Noh, J. Kong, K. Char, Y. D. Park, S. Bu, Jong-Gul Yoon and 1 more. 2005
240 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/24a642deb1a42363bbb7768adc504d90ff29996d