Comparison and Reduction of Conducted EMI in SiC JFET and Si IGBT-Based Motor Drives
By X. Gong, J. Ferreira. IEEE transactions on power electronics, 2014
139 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/2330d889267accdd9549f36af4e4960b711814bc
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Electrical and Electronic Engineering
- Yihua Hu
- Leon M. Tolbert
- Fei Fred Wang
- Alejandro G. Yepes
- J. Doval‐Gandoy
- Wenping Cao
- Frede Blaabjerg
- U. Choi
Citations in the corpus
- In Situ Diagnostics and Prognostics of Solder Fatigue in IGBT Modules for Electric Vehicle Drives (2015, background): “aircraft [4], wind turbines [5], smart grids [6], and industrial drives [7], primarily due to their superior performance in terms”
- Wide Bandgap Devices in AC Electric Drives: Opportunities and Challenges (2019, methodology): “In [95], the conducted EMI performance in SiC JFET and Si IGBT based motor drives has been compared.”
- Temperature-Dependent Characterization, Modeling, and Switching Speed-Limitation Analysis of Third-Generation 10-kV SiC MOSFET (2018, background): “Some works about impact factors on the switching performance have been conducted for LV SiC devices including signal isolator [33], parasitic [34], crosstalk issue [35], electromagnetic interference (EMI) [36], and impact of load [37], but these works have not been extended into HV SiC devices.”