Contact resistance in organic transistors that use source and drain electrodes formed by soft contact lamination

By J. Zaumseil, K. Baldwin, John A. Rogers. 2003

317 citations recorded by the source corpus.

Subfields: Biomedical Engineering, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/227a258c56d7e5ad21cc937ec9d69b2b3259ee62

How researchers see this paper

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In Electrical and Electronic Engineering

1. Jang Yeon Kwon

Citations in the corpus

• 42.2: World's Largest (15‐inch) XGA AMLCD Panel Using IGZO Oxide TFT (2008, background): “From the same point of view, IGZO thickness effect can also be connected with parasitic resistance (Rp) that includes not only S/D interface resistance but also bulk effect [6].”