An analytical retention model for SONOS nonvolatile memory devices in the excess electron state

By Yu Wang, Marvin H. White. International Semiconductor Device Research Symposium, 2003

147 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/220154f3a1c65823052681afe3ac33a6fca13420