High-concentration solvent exfoliation of graphene.
By U. Khan, A. O’Neill, Mustafa Lotya, S. De, Jonathan N. Coleman. Small, 2010
984 citations recorded by the source corpus.
A method is demonstrated to prepare graphene dispersions at high concentrations, up to 1.2 mg mL(-1), with yields of up to 4 wt% monolayers. This process relies on low-power sonication for long times, up to 460 h. Transmission electron microscopy shows the sonication to reduce the flake size, with flake dimensions scaling as t(-1/2). However, the mean flake length remains above 1 microm for all sonication times studied. Raman spectroscopy shows defects are introduced by the sonication process. However, detailed analysis suggests that predominantly edge, rather than basal-plane, defects are introduced. These dispersions are used to prepare high-quality free-standing graphene films. The dispersions can be heavily diluted by water without sedimentation or aggregation. This method facilitates graphene processing for a range of applications.
Subfields: Biomedical Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/21993de59e7e9a28c305f34364da85302966b9e6
How researchers see this paper
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In Biomedical Engineering
- Jonathan N. Coleman
- U. Khan
- A. O’Neill
- Tawfique Hasan
- Francesco Bonaccorso
- Zhipei Sun
- Ben P. Dobson
- David W. Johnson
In Materials Chemistry
- Tawfique Hasan
- Zhipei Sun
- Jonathan N. Coleman
- Francesco Bonaccorso
- Andrea C. Ferrari
- F. Torrisi
- U. Khan
- A. O’Neill
Citations in the corpus
- Polymer-stabilized graphene dispersions at high concentrations in organic solvents for nanocomposite production (2011, neutral): “prolonged centrifugation [50].”
- Morphology and electrical properties of graphene-epoxy nanocomposites obtained by different solvent assisted processing methods (2013, positive): “The possibility of dispersing graphene in different solvents is already widely reported in literature [22–25] and the exfoliation level obtained is quite easy to measure with common techniques, such as, Raman spectroscopy, transmission electron microscopy and atomic force microscopy.”