Raman microspectroscopy analysis of pressure-induced metallization in scratching of silicon

By Yury Gogotsi, Guohui Zhou, S. Ku, S. Cetinkunt. 2001

147 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/21222e16c442d1a37e70c6c185a695f5776f6468

Citations in the corpus

• Diamond machining of silicon: A review of advances in molecular dynamics simulation (2015, unknown): “[171] used a nano-scratching test to demonstrate the influence of geometry of the indenter in driving the various phases during contact loading of silicon on the (111) crystal orientation.”